igt@kms_flip_scaled_crc@flip* - skip - No dynamic tests executed
Stdout
Opened device: /dev/dri/card0
Starting subtest: flip-32bpp-yftileccs-to-64bpp-yftile-upscaling
No dynamic tests executed.
Subtest flip-32bpp-yftileccs-to-64bpp-yftile-upscaling: SKIP (0.000s)
Stderr
Starting subtest: flip-32bpp-yftileccs-to-64bpp-yftile-upscaling
Subtest flip-32bpp-yftileccs-to-64bpp-yftile-upscaling: SKIP (0.000s)
Dmesg
<6> [97.738203] [IGT] kms_flip_scaled_crc: executing
<7> [97.751682] i915 0000:00:02.0: [drm:i915_gem_open [i915]]
<7> [97.756285] i915 0000:00:02.0: [drm:i915_drop_caches_set [i915]] Dropping caches: 0x000001dc [0x000001dc]
<7> [97.758041] i915 0000:00:02.0: [drm:i915_gem_open [i915]]
<7> [97.816182] [drm:drm_helper_probe_single_connector_modes [drm_kms_helper]] [CONNECTOR:236:DP-1]
<7> [97.816317] i915 0000:00:02.0: [drm:intel_dp_detect [i915]] [CONNECTOR:236:DP-1]
<7> [97.817733] i915 0000:00:02.0: [drm:intel_power_well_enable [i915]] enabling always-on
<7> [97.819410] i915 0000:00:02.0: [drm:intel_power_well_enable [i915]] enabling DC_off