igt@sysfs_timeslice_duration@timeout@ccs2 - abort - This test was killed due to a kernel taint

http://gfx-ci.igk.intel.com/cibuglog-ng/testresult/1519466333?query_key=50699d5a9abbef6944d79d1fdb253ff67eb07254

Stdout	
Opened device: /dev/dri/card0
Starting subtest: timeout
Starting dynamic subtest: ccs2
Minimum timeout measured as 6.064ms; setting error threshold to 50ms
timeslice_duration_ms:1, elapsed=9.226ms
runner: This test was killed due to a kernel taint (0x240).



This test caused an abort condition: Kernel badly tainted (0x240, 0x200) (check dmesg for details):
	TAINT_WARN: WARN_ON has happened.

Stderr	
Starting subtest: timeout
Starting dynamic subtest: ccs2
Received signal SIGQUIT.
Stack trace: 
 #0 [fatal_sig_handler+0x10f]
 #1 [killpg+0x40]
 #2 [__test_timeout+0x1a8]
 #3 [test_timeout+0x1a8]
 #4 [dyn_sysfs_engines+0x167]
 #5 [__igt_unique____real_main553+0x20f]
 #6 [main+0x2d]
 #7 [__libc_start_main+0xf3]
 #8 [_start+0x2e]

Dmesg	
<6> [385.300775] Console: switching to colour dummy device 80x25
<6> [385.301118] [IGT] sysfs_timeslice_duration: executing
<6> [385.301400] pcieport 0000:00:1b.0: AER: Corrected error received: 0000:05:00.0
<4> [385.301410] nvme 0000:05:00.0: PCIe Bus Error: severity=Corrected, type=Physical Layer, (Receiver ID)
<4> [385.301412] nvme 0000:05:00.0:   device [15b7:5006] error status/mask=00000001/0000e000
<4> [385.301414] nvme 0000:05:00.0:    [ 0] RxErr                  (First)
<7> [385.303721] i915 0000:03:00.0: [drm:i915_gem_open [i915]] 
<7> [385.304498] i915 0000:03:00.0: [drm:i915_drop_caches_set [i915]] Dropping caches: 0x000001dc [0x000001dc]
<7> [385.305206] i915 0000:03:00.0: [drm:i915_gem_open [i915]] 
<7> [385.305782] i915 0000:03:00.0: [drm:i915_gem_open [i915]] 
<6> [385.311236] [IGT] sysfs_timeslice_duration: starting subtest timeout
<6> [385.311937] [IGT] sysfs_timeslice_duration: starting dynamic subtest ccs2
<7> [385.312099] i915 0000:03:00.0: [drm:i915_drop_caches_set [i915]] Dropping caches: 0x0000005c [0x0000005c]