igt@kms_flip_scaled_crc@flip* - skip - No dynamic tests executed
Stdout
Using IGT_SRANDOM=1714443606 for randomisation
Opened device: /dev/dri/card0
Starting subtest: flip-64bpp-linear-to-16bpp-linear-upscaling
No dynamic tests executed.
Subtest flip-64bpp-linear-to-16bpp-linear-upscaling: SKIP (0.000s)
Stderr
Starting subtest: flip-64bpp-linear-to-16bpp-linear-upscaling
Subtest flip-64bpp-linear-to-16bpp-linear-upscaling: SKIP (0.000s)
Dmesg
<6> [283.086463] [IGT] kms_flip_scaled_crc: executing
<7> [283.092321] xe 0000:00:02.0: [drm:drm_helper_probe_single_connector_modes [drm_kms_helper]] [CONNECTOR:189:DP-1]
<7> [283.092342] xe 0000:00:02.0: [drm:intel_dp_detect [xe]] [CONNECTOR:189:DP-1]
<7> [283.092459] xe 0000:00:02.0: [drm:drm_helper_probe_single_connector_modes [drm_kms_helper]] [CONNECTOR:189:DP-1] disconnected
<7> [283.092752] xe 0000:00:02.0: [drm:drm_helper_probe_single_connector_modes [drm_kms_helper]] [CONNECTOR:202:DP-2]
<7> [283.092762] xe 0000:00:02.0: [drm:intel_dp_detect [xe]] [CONNECTOR:202:DP-2]
<7> [283.092848] xe 0000:00:02.0: [drm:drm_helper_probe_single_connector_modes [drm_kms_helper]] [CONNECTOR:202:DP-2] disconnected